Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors

R Hou, M Spirito, R Heeres, F van Rijs, LCN de Vreede

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings - 2015 IEEE MTT-S International Microwave Symposium
Editors s.n.
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-3
Number of pages3
ISBN (Print)978-147998275-2
DOIs
Publication statusPublished - 2015
EventIEEE MTT-S IMS 2015, Phoenix, AZ, USA - Piscataway, NJ, USA
Duration: 17 May 201522 May 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceIEEE MTT-S IMS 2015, Phoenix, AZ, USA
Period17/05/1522/05/15

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