@inproceedings{4da288e863e94a09925ae3225585d523,
title = "Non-intrusive near-field characterization of distributed effects in large-periphery LDMOS RF power transistors",
author = "R Hou and M Spirito and R Heeres and {van Rijs}, F and {de Vreede}, LCN",
note = "Harvest; IEEE MTT-S IMS 2015, Phoenix, AZ, USA ; Conference date: 17-05-2015 Through 22-05-2015",
year = "2015",
doi = "10.1109/MWSYM.2015.7166945",
language = "English",
isbn = "978-147998275-2",
publisher = "IEEE",
pages = "1--3",
editor = "s.n.",
booktitle = "Proceedings - 2015 IEEE MTT-S International Microwave Symposium",
address = "United States",
}