Non-linear distortion and OFDM bit error rate

C van Bos, MHL Kouwenhoven, CJM Verhoeven

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original languageUndefined/Unknown
Title of host publicationSAFE99: proceedings. ProRISC99: proceedings [CD-ROM]
Editors JP Veen
Place of PublicationUtrecht
PublisherSTW Technology Foundation
Pages659-663
Number of pages5
ISBN (Print)90-73461-18-9
Publication statusPublished - 1999
Event2nd Annual Workshop on Semiconductor Advances for Future Electronics. IEEE 10th Annual Workshop on Circuits, Systems and Signal Processing, Mierlo - Utrecht
Duration: 24 Nov 1999 → 25 Nov 1999

Publication series

Name
PublisherSTW technology foundation

Conference

Conference2nd Annual Workshop on Semiconductor Advances for Future Electronics. IEEE 10th Annual Workshop on Circuits, Systems and Signal Processing, Mierlo
Period24/11/99 → 25/11/99

Keywords

  • ZX Int.klas.verslagjaar < 2002

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