Novel dielectric diffusion depth profiling technique for detecting degradation in epoxy coatings

M Giacomelli Penon, SJ Picken, J van Turnhout

    Research output: Contribution to conferencePosterProfessional

    Original languageUndefined/Unknown
    Publication statusPublished - 2004
    Event3rd International Conference on Broadband Dielectric Spectroscopy and its Applications - Delft
    Duration: 23 Aug 200426 Aug 2004

    Conference

    Conference3rd International Conference on Broadband Dielectric Spectroscopy and its Applications
    Period23/08/0426/08/04

    Keywords

    • Geen BTA classificatie

    Cite this

    Giacomelli Penon, M., Picken, SJ., & van Turnhout, J. (2004). Novel dielectric diffusion depth profiling technique for detecting degradation in epoxy coatings. Poster session presented at 3rd International Conference on Broadband Dielectric Spectroscopy and its Applications, .