Novel dielectric diffusion depth profiling technique for detecting degradation in epoxy coatings

Research output: Contribution to conference › Poster › Professional

Original language	Undefined/Unknown
Publication status	Published - 2004
Event	3rd International Conference on Broadband Dielectric Spectroscopy and its Applications - Delft Duration: 23 Aug 2004 → 26 Aug 2004

Conference	3rd International Conference on Broadband Dielectric Spectroscopy and its Applications
Period	23/08/04 → 26/08/04

Keywords

@conference{bde386a7e53c4e88a4e4302ffedbc60a,

title = "Novel dielectric diffusion depth profiling technique for detecting degradation in epoxy coatings",

keywords = "Geen BTA classificatie",

author = "{Giacomelli Penon}, M and SJ Picken and {van Turnhout}, J",

year = "2004",

language = "Undefined/Unknown",

note = "3rd International Conference on Broadband Dielectric Spectroscopy and its Applications ; Conference date: 23-08-2004 Through 26-08-2004",

}

TY - CONF

T1 - Novel dielectric diffusion depth profiling technique for detecting degradation in epoxy coatings

AU - Giacomelli Penon, M

AU - Picken, SJ

AU - van Turnhout, J

PY - 2004

Y1 - 2004

KW - Geen BTA classificatie

M3 - Poster

T2 - 3rd International Conference on Broadband Dielectric Spectroscopy and its Applications

Y2 - 23 August 2004 through 26 August 2004

ER -