On Correcting Cluster Errors in Nanoelectronic Memories

NZB Haron, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings of 3rd Workshop on Design for Reliability (DFR'11)
EditorsA Orailoglu, MK Michael, Y Sazeides, T Theocharides
Place of PublicationCrete, Greece
PublisherHiPEAC
Pages63-68
Number of pages6
ISBN (Print)978-1-4503-0241-8
Publication statusPublished - 2011
EventDFR'11 - Crete, Greece
Duration: 23 Jan 201123 Jan 2011

Publication series

Name
PublisherHiPEAC

Conference

ConferenceDFR'11
Period23/01/1123/01/11

Keywords

  • Conf.proc. > 3 pag

Cite this

Haron, NZB., & Hamdioui, S. (2011). On Correcting Cluster Errors in Nanoelectronic Memories. In A. Orailoglu, MK. Michael, Y. Sazeides, & T. Theocharides (Eds.), Proceedings of 3rd Workshop on Design for Reliability (DFR'11) (pp. 63-68). HiPEAC.