On-load tap changer diagnosis: interpretation of dynamic resistance deviations

JJ Erbrink; E Gulski; JJ Smit; R Leich; PP Seitz; B Quak

doi:doi:10.1109/ELINSL.2010.5549787

On-load tap changer diagnosis: interpretation of dynamic resistance deviations

JJ Erbrink, E Gulski, JJ Smit, R Leich, PP Seitz, B Quak

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Conference record of the 2010 IEEE International symposium on electrical insulation (ISEI)
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE
Pages	1-5
Number of pages	5
ISBN (Print)	978-1-4244-6298-8
DOIs	https://doi.org/doi:10.1109/ELINSL.2010.5549787
Publication status	Published - 2010
Event	2010 IEEE International symposium on electrical insulation (ISEI), San Diego - Piscataway Duration: 6 Jun 2010 → 9 Jun 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	2010 IEEE International symposium on electrical insulation (ISEI), San Diego
Period	6/06/10 → 9/06/10

Keywords

Conf.proc. > 3 pag

Access to Document

doi:10.1109/ELINSL.2010.5549787

Cite this

@inproceedings{9d731119f7a347b0a4dfc2b0b495beae,

title = "On-load tap changer diagnosis: interpretation of dynamic resistance deviations",

keywords = "Conf.proc. > 3 pag",

author = "JJ Erbrink and E Gulski and JJ Smit and R Leich and PP Seitz and B Quak",

year = "2010",

doi = "doi:10.1109/ELINSL.2010.5549787",

language = "Undefined/Unknown",

isbn = "978-1-4244-6298-8",

publisher = "IEEE",

pages = "1--5",

editor = "s.n.",

booktitle = "Conference record of the 2010 IEEE International symposium on electrical insulation (ISEI)",

address = "United States",

note = "2010 IEEE International symposium on electrical insulation (ISEI), San Diego ; Conference date: 06-06-2010 Through 09-06-2010",

}

Erbrink, JJ, Gulski, E, Smit, JJ, Leich, R, Seitz, PP & Quak, B 2010, On-load tap changer diagnosis: interpretation of dynamic resistance deviations. in s.n. (ed.), Conference record of the 2010 IEEE International symposium on electrical insulation (ISEI). IEEE, Piscataway, pp. 1-5, 2010 IEEE International symposium on electrical insulation (ISEI), San Diego, 6/06/10. https://doi.org/doi:10.1109/ELINSL.2010.5549787

On-load tap changer diagnosis: interpretation of dynamic resistance deviations. / Erbrink, JJ; Gulski, E; Smit, JJ et al.
Conference record of the 2010 IEEE International symposium on electrical insulation (ISEI). ed. / s.n. Piscataway: IEEE, 2010. p. 1-5.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - On-load tap changer diagnosis: interpretation of dynamic resistance deviations

AU - Erbrink, JJ

AU - Gulski, E

AU - Smit, JJ

AU - Leich, R

AU - Seitz, PP

AU - Quak, B

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

U2 - doi:10.1109/ELINSL.2010.5549787

DO - doi:10.1109/ELINSL.2010.5549787

M3 - Conference contribution

SN - 978-1-4244-6298-8

SP - 1

EP - 5

BT - Conference record of the 2010 IEEE International symposium on electrical insulation (ISEI)

A2 - s.n., null

PB - IEEE

CY - Piscataway

T2 - 2010 IEEE International symposium on electrical insulation (ISEI), San Diego

Y2 - 6 June 2010 through 9 June 2010

ER -