On-load tap changer's dynamic resistance measurement

JJ Erbrink, J Aditya, LA Chmura, JJ Smit, R Leich, B Quak

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Abstract

    An on-load tap changer (OLTC) is prone to many different defects and degradation mechanisms due to its continuous operation under load condition. A high load current and high operation temperature accelerate the process of contact wear. Contacts erode due to the fact that under certain conditions the contacts develop a resistive layer due to hot insulation oil. As a major cause of OLTC failure, these defects might take place after some years of operation and their frequency increases with the operation time. Regular maintenance is applied due to degradation of the insulation oil. Dynamic resistance measurement (DRM) can be conducted during this maintenance to measure the resistance of the OLTC when it operates. The measurement results provide important information for assessing the actual condition of the OLTC. This paper aims to analyze the effect of test parameters on DRM results from service-aged OLTCs and describes the implementation of DRM in OLTC condition assessment. Two test parameters were selected for observation: the test current amplitude and the circuit resistance. Their amplitude was varied during laboratory experiments as well as on-site after regular maintenance. To quantify the various measurement results, an analytical tool using 4 performance parameters has been developed. Finally for interpretation, with the help of a three dimensional classification system which is presented in this paper, the actual condition of OLTCs can be identified during maintenance activities.
    Original languageEnglish
    Title of host publicationElectrical Insulation Conference 2011
    EditorsN Frost, P Gaberson
    Place of PublicationPiscataway, NJ, USA
    PublisherIEEE Society
    Pages54-58
    Number of pages5
    ISBN (Print)978-1-4577-0276-1
    DOIs
    Publication statusPublished - 2011
    EventEIC 2011 - Piscataway, NJ, USA
    Duration: 5 Jun 20118 Jun 2011

    Publication series

    Name
    PublisherIEEE

    Conference

    ConferenceEIC 2011
    Period5/06/118/06/11

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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