On p-n junction depletion capacitance parameter extraction strategies

V Milovanovic, R van der Toorn

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Title of host publicationProceedings 2010 27th International Conference on Microelectronics (MIEL)
EditorsN Stojadinovic et al
Place of PublicationLos Alamitos, CA, USA
PublisherIEEE Society
Pages87-90
Number of pages4
ISBN (Print)978-1-4244-7200-0
DOIs
Publication statusPublished - 2010
Event27th International Conference on Microelectronics, Nis, Serbia - Los Alamitos, CA, USA
Duration: 16 May 201019 May 2010

Publication series

Name
PublisherIEEE

Conference

Conference27th International Conference on Microelectronics, Nis, Serbia
Period16/05/1019/05/10

Keywords

  • Conf.proc. > 3 pag

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