On p-n junction depletion capacitance parameter extraction strategies

V Milovanovic; R van der Toorn

doi:10.1109/MIEL.2010.5490528

On p-n junction depletion capacitance parameter extraction strategies

Electronic Components, Technology and Materials

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	Proceedings 2010 27th International Conference on Microelectronics (MIEL)
Editors	N Stojadinovic et al
Place of Publication	Los Alamitos, CA, USA
Publisher	IEEE Society
Pages	87-90
Number of pages	4
ISBN (Print)	978-1-4244-7200-0
DOIs	https://doi.org/10.1109/MIEL.2010.5490528
Publication status	Published - 2010
Event	27th International Conference on Microelectronics, Nis, Serbia - Los Alamitos, CA, USA Duration: 16 May 2010 → 19 May 2010

Publication series

Name
Publisher	IEEE

Conference

Conference	27th International Conference on Microelectronics, Nis, Serbia
Period	16/05/10 → 19/05/10

Keywords

Conf.proc. > 3 pag

Access to Document

10.1109/MIEL.2010.5490528

Cite this

@inproceedings{7079e365022445a3b47eaf21f6e4d505,

title = "On p-n junction depletion capacitance parameter extraction strategies",

keywords = "Conf.proc. > 3 pag",

author = "V Milovanovic and {van der Toorn}, R",

year = "2010",

doi = "10.1109/MIEL.2010.5490528",

language = "English",

isbn = "978-1-4244-7200-0",

publisher = "IEEE Society",

pages = "87--90",

editor = "{Stojadinovic et al}, N",

booktitle = "Proceedings 2010 27th International Conference on Microelectronics (MIEL)",

note = "27th International Conference on Microelectronics, Nis, Serbia ; Conference date: 16-05-2010 Through 19-05-2010",

}

Milovanovic, V & van der Toorn, R 2010, On p-n junction depletion capacitance parameter extraction strategies. in N Stojadinovic et al (ed.), Proceedings 2010 27th International Conference on Microelectronics (MIEL). IEEE Society, Los Alamitos, CA, USA, pp. 87-90, 27th International Conference on Microelectronics, Nis, Serbia, 16/05/10. https://doi.org/10.1109/MIEL.2010.5490528

On p-n junction depletion capacitance parameter extraction strategies. / Milovanovic, V; van der Toorn, R.

Proceedings 2010 27th International Conference on Microelectronics (MIEL). ed. / N Stojadinovic et al. Los Alamitos, CA, USA : IEEE Society, 2010. p. 87-90.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - On p-n junction depletion capacitance parameter extraction strategies

AU - Milovanovic, V

AU - van der Toorn, R

PY - 2010

Y1 - 2010

KW - Conf.proc. > 3 pag

U2 - 10.1109/MIEL.2010.5490528

DO - 10.1109/MIEL.2010.5490528

M3 - Conference contribution

SN - 978-1-4244-7200-0

SP - 87

EP - 90

BT - Proceedings 2010 27th International Conference on Microelectronics (MIEL)

A2 - Stojadinovic et al, N

PB - IEEE Society

CY - Los Alamitos, CA, USA

T2 - 27th International Conference on Microelectronics, Nis, Serbia

Y2 - 16 May 2010 through 19 May 2010

ER -