On resistive open defect detection in DRAMs: The charge accumulation effect

Y Sfikas, YE Tsiatouhas, M Taouil, S Hamdioui

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationProceedings - 20th IEEE European Test Symposium
EditorsL Miclea, P Prinetto
Place of PublicationPiscataway, NJ, USA
PublisherIEEE Society
Pages1-6
Number of pages6
ISBN (Print)978-1-4799-7603-4
DOIs
Publication statusPublished - 2015
EventETS 2015, Cluj-Napoca, Romania - Piscataway, NJ, USA
Duration: 25 May 201529 May 2015

Publication series

Name
PublisherIEEE

Conference

ConferenceETS 2015, Cluj-Napoca, Romania
Period25/05/1529/05/15

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