On the Analysis of Real-time Operating System Reliability in Embedded Systems

Dario Mamone; Alberto  Bosio; Alessandro Savino; Said Hamdioui; Maurizio  Rebaudengo

doi:10.1109/DFT50435.2020.9250861

On the Analysis of Real-time Operating System Reliability in Embedded Systems

Dario Mamone, Alberto Bosio, Alessandro Savino, Said Hamdioui, Maurizio Rebaudengo

Quantum & Computer Engineering

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

9 Citations (Scopus)

380 Downloads (Pure)

Abstract

Nowadays, the reliability has become one of the main issues for safety-critical embedded systems, like automotive, aerospace and avionic. In an embedded system, the full system stack usually includes, between the hardware layer and the software/application layer, a middle layer composed by the Operating System (OS) and the middleware. Most of the time, in the literature only the application-layer is considered during the reliability analysis. This is due to the fact that middle layer short execution time makes the probability of a fault affecting it much lower compared to the application-level. Nevertheless, middle layer data structures lifespan is equivalent to the application layer ones. Moreover, all the times a hardware fault propagates to the middle-layer as an error, and especially to the OS, its impact can be expected to be potentially catastrophic. The aim of this work is to study the reliability of a Real-Time Operating System (RTOS) affected by Single Event Upset (SEU) faults. The methodology targets the most relevant variables and data structures of FreeRTOS analyzed through a software-based fault injection. Results show the ability to highlight the criticality in the OS fault tolerance, in terms of system integrity, data integrity and the overall inherent resiliency to faults, potentially leading to selective hardening of the OS.

Original language	English
Title of host publication	33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020
Subtitle of host publication	Proceedings
Editors	Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua
Publisher	IEEE
Pages	1-6
Number of pages	6
ISBN (Electronic)	978-1-7281-9457-8
ISBN (Print)	978-1-7281-9458-5
DOIs	https://doi.org/10.1109/DFT50435.2020.9250861
Publication status	Published - 2020
Event	2020 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - On-line Virtual Event Duration: 19 Oct 2020 → 21 Oct 2020 Conference number: 33rd

Publication series

Name	33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020

Conference

Conference	2020 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Abbreviated title	DFT 2020
Period	19/10/20 → 21/10/20

Bibliographical note

Accepted author manuscript

Keywords

Embedded Systems
Real-Time Operating System
Fault Injection
Reliability

Access to Document

10.1109/DFT50435.2020.9250861

camera_readyAccepted author manuscript, 378 KB

Cite this

Mamone, D., Bosio, A., Savino, A., Hamdioui, S., & Rebaudengo, M. (2020). On the Analysis of Real-time Operating System Reliability in Embedded Systems. In L. Dilillo, M. Psarakis, & T. Siddiqua (Eds.), 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings (pp. 1-6). Article 9250861 (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020). IEEE. https://doi.org/10.1109/DFT50435.2020.9250861

Mamone, Dario ; Bosio, Alberto ; Savino, Alessandro et al. / On the Analysis of Real-time Operating System Reliability in Embedded Systems. 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings. editor / Luigi Dilillo ; Mihalis Psarakis ; Taniya Siddiqua. IEEE, 2020. pp. 1-6 (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020).

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Mamone, D, Bosio, A, Savino, A, Hamdioui, S & Rebaudengo, M 2020, On the Analysis of Real-time Operating System Reliability in Embedded Systems. in L Dilillo, M Psarakis & T Siddiqua (eds), 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings., 9250861, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020, IEEE, pp. 1-6, 2020 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems , 19/10/20. https://doi.org/10.1109/DFT50435.2020.9250861

On the Analysis of Real-time Operating System Reliability in Embedded Systems. / Mamone, Dario; Bosio, Alberto; Savino, Alessandro et al.
33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings. ed. / Luigi Dilillo; Mihalis Psarakis; Taniya Siddiqua. IEEE, 2020. p. 1-6 9250861 (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020).

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

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AU - Bosio, Alberto

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AB - Nowadays, the reliability has become one of the main issues for safety-critical embedded systems, like automotive, aerospace and avionic. In an embedded system, the full system stack usually includes, between the hardware layer and the software/application layer, a middle layer composed by the Operating System (OS) and the middleware. Most of the time, in the literature only the application-layer is considered during the reliability analysis. This is due to the fact that middle layer short execution time makes the probability of a fault affecting it much lower compared to the application-level. Nevertheless, middle layer data structures lifespan is equivalent to the application layer ones. Moreover, all the times a hardware fault propagates to the middle-layer as an error, and especially to the OS, its impact can be expected to be potentially catastrophic. The aim of this work is to study the reliability of a Real-Time Operating System (RTOS) affected by Single Event Upset (SEU) faults. The methodology targets the most relevant variables and data structures of FreeRTOS analyzed through a software-based fault injection. Results show the ability to highlight the criticality in the OS fault tolerance, in terms of system integrity, data integrity and the overall inherent resiliency to faults, potentially leading to selective hardening of the OS.

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Mamone D, Bosio A, Savino A, Hamdioui S, Rebaudengo M. On the Analysis of Real-time Operating System Reliability in Embedded Systems. In Dilillo L, Psarakis M, Siddiqua T, editors, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020: Proceedings. IEEE. 2020. p. 1-6. 9250861. (33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020). doi: 10.1109/DFT50435.2020.9250861

On the Analysis of Real-time Operating System Reliability in Embedded Systems

Abstract

Publication series

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Bibliographical note

Keywords

Access to Document

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