On the Definition of Reference Planes in Probe-level Calibrations

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

10 Citations (Scopus)


In this contribution we analyze the definition of reference planes in probe-level calibrations. The removal of the probe type from the calibration definition is presented first analyzing the transition discontinuities and defining to which extent they have to be incorporated in the calibration error terms. Subsequently a commercial calibration, which is defined specific to a probe topology, is considered and its frequency dependent standard response are computed accurately via a 3D EM simulator. These probe independent standard definitions are then used to compare the accuracy achieved on the same structures, (i.e., CPW lines of different lengths) from two different probe topologies. Finally, the data from both probes are compared, using a worst bound metric, to the data achieved when using the probe specific calibration data showing an accuracy improvement for the probe independent approach, validating the improved identification of the reference plane proposed here.
Original languageEnglish
Title of host publication87th ARFTG Microwave Measurement Conference, ARFTG 2016
Subtitle of host publicationMeasurements for Emerging Communications Technologies
Place of PublicationDanvers, MA
Number of pages4
ISBN (Electronic)978-1-5090-1308-1
Publication statusPublished - 2016
Event87th ARFTG Microwave Measurement Conference: Measurements for Emerging Communications Technologies - San Francisco, CA, United States
Duration: 27 May 201627 May 2016
Conference number: 87


Conference87th ARFTG Microwave Measurement Conference
Abbreviated titleARFTG MMC 2016
Country/TerritoryUnited States
CitySan Francisco, CA


  • RSOL
  • VNA
  • calibration
  • on-wafer
  • EM simulation
  • wafer probes


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