On the Impact of Radiation Losses in TRL Calibrations

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

6 Citations (Scopus)

Abstract

In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of TRL on-wafer calibrations for mm-wave operation. A quantitative analysis based on 3D EM simulation is performed to provide guidelines on the material to be used as the calibration substrate, the backside conditions, and the accuracy that can then be expected. Finally experimental data providing qualitative indication of the quality of calibrations on different media are presented for the WR10 band.

Original languageEnglish
Title of host publication2018 91st ARFTG Microwave Measurement Conference
Subtitle of host publicationWideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018
EditorsDominique Schreurs
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages5
ISBN (Electronic)978-1-5386-5450-7
ISBN (Print)978-1-5386-5451-4
DOIs
Publication statusPublished - 2018
EventARFTG 2018: 91st ARFTG Microwave Measurement Conference - Philadelphia, United States
Duration: 15 Jun 201815 Jun 2018

Conference

ConferenceARFTG 2018: 91st ARFTG Microwave Measurement Conference
Abbreviated titleARFTG 2018
CountryUnited States
CityPhiladelphia
Period15/06/1815/06/18

Keywords

  • (sub)mm-wave
  • dispersion
  • multimode propagation
  • on-wafer calibration
  • Surface waves

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