On the Impact of Radiation Losses in TRL Calibrations

M. Spirito; C. De Martino; L. Galatro

doi:10.1109/ARFTG.2018.8423820

On the Impact of Radiation Losses in TRL Calibrations

Electronics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

11 Citations (Scopus)

Abstract

In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of TRL on-wafer calibrations for mm-wave operation. A quantitative analysis based on 3D EM simulation is performed to provide guidelines on the material to be used as the calibration substrate, the backside conditions, and the accuracy that can then be expected. Finally experimental data providing qualitative indication of the quality of calibrations on different media are presented for the WR10 band.

Original language	English
Title of host publication	2018 91st ARFTG Microwave Measurement Conference
Subtitle of host publication	Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018
Editors	Dominique Schreurs
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Number of pages	5
ISBN (Electronic)	978-1-5386-5450-7
ISBN (Print)	978-1-5386-5451-4
DOIs	https://doi.org/10.1109/ARFTG.2018.8423820
Publication status	Published - 2018
Event	ARFTG 2018: 91st ARFTG Microwave Measurement Conference - Philadelphia, United States Duration: 15 Jun 2018 → 15 Jun 2018

Conference

Conference	ARFTG 2018: 91st ARFTG Microwave Measurement Conference
Abbreviated title	ARFTG 2018
Country/Territory	United States
City	Philadelphia
Period	15/06/18 → 15/06/18

Keywords

(sub)mm-wave
dispersion
multimode propagation
on-wafer calibration
Surface waves

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10.1109/ARFTG.2018.8423820

Cite this

Spirito, M., De Martino, C., & Galatro, L. (2018). On the Impact of Radiation Losses in TRL Calibrations. In D. Schreurs (Ed.), 2018 91st ARFTG Microwave Measurement Conference: Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018 Article 8423820 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ARFTG.2018.8423820

@inproceedings{2dc61d56f30d46a4a5bb34ea1a7a5d05,

title = "On the Impact of Radiation Losses in TRL Calibrations",

abstract = "In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of TRL on-wafer calibrations for mm-wave operation. A quantitative analysis based on 3D EM simulation is performed to provide guidelines on the material to be used as the calibration substrate, the backside conditions, and the accuracy that can then be expected. Finally experimental data providing qualitative indication of the quality of calibrations on different media are presented for the WR10 band.",

keywords = "(sub)mm-wave, dispersion, multimode propagation, on-wafer calibration, Surface waves",

author = "M. Spirito and {De Martino}, C. and L. Galatro",

year = "2018",

doi = "10.1109/ARFTG.2018.8423820",

language = "English",

isbn = "978-1-5386-5451-4 ",

editor = "Schreurs, {Dominique }",

booktitle = "2018 91st ARFTG Microwave Measurement Conference",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "ARFTG 2018: 91st ARFTG Microwave Measurement Conference, ARFTG 2018 ; Conference date: 15-06-2018 Through 15-06-2018",

}

Spirito, M , De Martino, C & Galatro, L 2018, On the Impact of Radiation Losses in TRL Calibrations. in D Schreurs (ed.), 2018 91st ARFTG Microwave Measurement Conference: Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018., 8423820, Institute of Electrical and Electronics Engineers (IEEE), ARFTG 2018: 91st ARFTG Microwave Measurement Conference, Philadelphia, United States, 15/06/18. https://doi.org/10.1109/ARFTG.2018.8423820

On the Impact of Radiation Losses in TRL Calibrations. / Spirito, M.; De Martino, C.; Galatro, L.
2018 91st ARFTG Microwave Measurement Conference: Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018. ed. / Dominique Schreurs. Institute of Electrical and Electronics Engineers (IEEE), 2018. 8423820.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - On the Impact of Radiation Losses in TRL Calibrations

AU - Spirito, M.

AU - De Martino, C.

AU - Galatro, L.

PY - 2018

Y1 - 2018

N2 - In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of TRL on-wafer calibrations for mm-wave operation. A quantitative analysis based on 3D EM simulation is performed to provide guidelines on the material to be used as the calibration substrate, the backside conditions, and the accuracy that can then be expected. Finally experimental data providing qualitative indication of the quality of calibrations on different media are presented for the WR10 band.

AB - In this contribution we analyze the impact of radiation losses due to multimode propagations in (single medium) calibration substrates. The impact of the complex modelling of the loss mechanism due to radiation mode is applied to the specific case of TRL on-wafer calibrations for mm-wave operation. A quantitative analysis based on 3D EM simulation is performed to provide guidelines on the material to be used as the calibration substrate, the backside conditions, and the accuracy that can then be expected. Finally experimental data providing qualitative indication of the quality of calibrations on different media are presented for the WR10 band.

KW - (sub)mm-wave

KW - dispersion

KW - multimode propagation

KW - on-wafer calibration

KW - Surface waves

UR - http://www.scopus.com/inward/record.url?scp=85051553276&partnerID=8YFLogxK

U2 - 10.1109/ARFTG.2018.8423820

DO - 10.1109/ARFTG.2018.8423820

M3 - Conference contribution

AN - SCOPUS:85051553276

SN - 978-1-5386-5451-4

BT - 2018 91st ARFTG Microwave Measurement Conference

A2 - Schreurs, Dominique

PB - Institute of Electrical and Electronics Engineers (IEEE)

T2 - ARFTG 2018: 91st ARFTG Microwave Measurement Conference

Y2 - 15 June 2018 through 15 June 2018

ER -

Spirito M , De Martino C , Galatro L. On the Impact of Radiation Losses in TRL Calibrations. In Schreurs D, editor, 2018 91st ARFTG Microwave Measurement Conference: Wideband Modulated Test Signals for Network Analysis of Wireless Infrastructure Building Blocks, ARFTG 2018. Institute of Electrical and Electronics Engineers (IEEE). 2018. 8423820 doi: 10.1109/ARFTG.2018.8423820

On the Impact of Radiation Losses in TRL Calibrations

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