Abstract
Due to the immature manufacturing process, Resistive Random Access Memories (RRAMs) are prone to exhibit new failure mechanisms and faults, which should be efficiently detected for high-volume production. Those unique faults are hard to detect but require specific Design-for-Test (DfT) circuit design. This paper proposes a DfT based on a parallel-reference write circuit that can detect all RRAM array faults during diagnosis, production testing, and its application in the field.
| Original language | English |
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| Title of host publication | 2024 IEEE European Test Symposium (ETS) |
| Number of pages | 2 |
| ISBN (Electronic) | 979-8-3503-4932-0 |
| DOIs | |
| Publication status | Published - 2024 |
| Event | 2024 IEEE European Test Symposium - The Hague, Netherlands Duration: 20 May 2024 → 24 May 2024 |
Conference
| Conference | 2024 IEEE European Test Symposium |
|---|---|
| Abbreviated title | IETS 2024 |
| Country/Territory | Netherlands |
| City | The Hague |
| Period | 20/05/24 → 24/05/24 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.