Optical and morphological characterization of nanostructured AgO thin films

Adeleh Granmayeh Rad; Hamed Abbasi

doi:10.30495/jtap.172304

Optical and morphological characterization of nanostructured AgO thin films

Adeleh Granmayeh Rad^*, Hamed Abbasi

^*Corresponding author for this work

ImPhys/Menzel group

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

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Abstract

Silver oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10⁻⁵ torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (R_avg), maximum peak to valley height (R_t) and root mean square (R_rms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n₂) of thin films is evaluated by the moiré deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.

Original language	English
Article number	172304
Number of pages	8
Journal	Journal of Theoretical and Applied Physics
Volume	17
Issue number	1
DOIs	https://doi.org/10.30495/jtap.172304
Publication status	Published - 2023

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

Keywords

Moiré deflectometry
Nonlinear refractive index
Optical property
Silver oxide thin film
Surface morphology

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abstract = "Silver oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10−5 torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (Ravg), maximum peak to valley height (Rt) and root mean square (Rrms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n2) of thin films is evaluated by the moir{\'e} deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.",

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author = "Rad, {Adeleh Granmayeh} and Hamed Abbasi",

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PY - 2023

Y1 - 2023

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AB - Silver oxide (AgO) thin films were prepared by using a cylindrical direct current reactive magnetron sputtering system at 10−5 torr initial pressure on BK7 glass substrate. Samples deposited for 3, 5 and 7 minutes. Surface characterization of AgO thin films in the nanometer scale can be accurately determined using the atomic force microscopy (AFM) and X-ray diffraction (XRD). The average roughness (Ravg), maximum peak to valley height (Rt) and root mean square (Rrms) roughness are used to analyze the surface morphology of AgO films. The linear optical absorption data were measured in the visible-near infrared spectral regions and the nonlinear refractive index (n2) of thin films is evaluated by the moiré deflectometery technique. The investigation indicates that, increase in AgO thickness leads to reduction in nonlinear refractive index.

KW - Moiré deflectometry

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Optical and morphological characterization of nanostructured AgO thin films

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