Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

J Huang; DS Golubovi¿; SW Koh; D Yang; X Li; X Fan; GQ Zhang

doi:10.1016/j.microrel.2015.09.008

Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

J Huang, DS Golubovi¿, SW Koh, D Yang, X Li, X Fan, GQ Zhang

Electronic Components, Technology and Materials

Research output: Contribution to journal › Article › Scientific › peer-review

8 Citations (Scopus)

Original language	English
Pages (from-to)	2654-2662
Number of pages	9
Journal	Microelectronics Reliability
Volume	55
Issue number	12, part B
DOIs	https://doi.org/10.1016/j.microrel.2015.09.008
Publication status	Published - 2015

Bibliographical note

Harvest
Available online 18-9-2015

Keywords

CWTS JFIS < 0.75

Access to Document

10.1016/j.microrel.2015.09.008

Cite this

@article{27c323456c01499cadc7056b3dc83d32,

title = "Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests",

keywords = "CWTS JFIS < 0.75",

author = "J Huang and DS Golubovi¿ and SW Koh and D Yang and X Li and X Fan and GQ Zhang",

note = "Harvest Available online 18-9-2015",

year = "2015",

doi = "10.1016/j.microrel.2015.09.008",

language = "English",

volume = "55",

pages = "2654--2662",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier",

number = "12, part B",

}

TY - JOUR

T1 - Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

AU - Huang, J

AU - Golubovi¿, DS

AU - Koh, SW

AU - Yang, D

AU - Li, X

AU - Fan, X

AU - Zhang, GQ

N1 - Harvest Available online 18-9-2015

PY - 2015

Y1 - 2015

KW - CWTS JFIS < 0.75

U2 - 10.1016/j.microrel.2015.09.008

DO - 10.1016/j.microrel.2015.09.008

M3 - Article

SN - 0026-2714

VL - 55

SP - 2654

EP - 2662

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 12, part B

ER -