Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests

J Huang, DS Golubovi¿, SW Koh, D Yang, X Li, X Fan, GQ Zhang

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)2654-2662
Number of pages9
JournalMicroelectronics Reliability
Volume55
Issue number12, part B
DOIs
Publication statusPublished - 2015

Bibliographical note

Harvest
Available online 18-9-2015

Keywords

  • CWTS JFIS < 0.75

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