Optical scattering properties of a nano-textured ZnO-silicon interface

K Jaeger, M Schulte, K Bittkau, AM Ermes, M Zeman, BE Pieters

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

5 Citations (Scopus)

Abstract

The scattering properties of transparent conductive oxide (TCO) layers are fundamentally related to the performance of thin film silicon solar cells. In this study we introduce an experimental technique to access light scattering properties at textured TCO-silicon interfaces. Therefore we prepared a sample with a polished microcrystalline silicon layer, which is deposited onto a rough TCO layer. We used the measured results to validate calculations obtained with rigorous diffraction theory, i.e. a numerical solution of Maxwell's equations. Furthermore we evaluated four approximate models based on the scalar scattering theory and ray tracing and compared them to the rigorous diffraction theory.
Original languageEnglish
Title of host publicationInternational Conference on Applications of Optics and Photonics 2011
EditorsMF Costa
Place of PublicationBraga, Portugal
PublisherSPOF
Pages1-7
Number of pages7
DOIs
Publication statusPublished - 2011
EventAOP2011 - Braga, Portugal
Duration: 3 May 20117 May 2011

Publication series

Name
PublisherSPOF
Name
VolumeSPIE 8001

Conference

ConferenceAOP2011
Period3/05/117/05/11

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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