Optimal accelerated aging tests for an epoxy resin insulation system

Q Zhuang, PHF Morshuis, X Chen, D Djairam, JJ Smit

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationInternational Conference on Condition Monitoring and Diagnosis, CMD 2010
    EditorsM Nagao et al
    Place of PublicationLos Alamitos, CA, USA
    PublisherIEEE Society
    Pages-
    Publication statusPublished - 2010
    EventInternational Conference on Condition Monitoring and Diagnosis, 2010, CMD 2010 - Los Alamitos, CA, USA
    Duration: 6 Sep 201011 Sep 2010

    Publication series

    Name
    PublisherIEEE

    Conference

    ConferenceInternational Conference on Condition Monitoring and Diagnosis, 2010, CMD 2010
    Period6/09/1011/09/10

    Keywords

    • conference contrib. refereed
    • Conf.proc. > 3 pag

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