Optimal experimental design of STEM measurement of atom column positions

S van Aert, AJ den Dekker, D Van Dyck, A van den Bos

    Research output: Contribution to journalArticleScientificpeer-review

    46 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)273-289
    Number of pages17
    JournalUltramicroscopy
    Volume90
    Issue number4
    Publication statusPublished - 2002

    Keywords

    • ZX CWTS 1.00 <= JFIS < 3.00

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