Optimization of negative stage bias potential for faster imaging in large-scale electron microscopy

Ryan Lane*, Yoram Vos, Anouk H.G. Wolters, Luc van Kessel, S. Elisa Chen, Nalan Liv, Judith Klumperman, Ben N.G. Giepmans, Jacob P. Hoogenboom

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

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