Optimizing stresses for testing DRAM cell defects using electrical simulations

Z Al-Ars, AJ van de Goor, J Braun, D Richter

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationDATE '03; design, automation and test in Europe
EditorsN Wehn, D Verkest
Place of PublicationPiscataway
PublisherIEEE Society
Pages484-489
Number of pages6
ISBN (Print)0-7695-1870-2
Publication statusPublished - 2003
Eventdesign, automation and test in Europe, Messe Munich, Germany - Piscataway
Duration: 3 Mar 20037 Mar 2003

Publication series

Name
PublisherIEEE

Conference

Conferencedesign, automation and test in Europe, Messe Munich, Germany
Period3/03/037/03/03

Keywords

  • Elektrotechniek
  • Techniek
  • Conf.proc. > 3 pag

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