@inproceedings{44fbbd033d1a4206bb8045ca097e3380,
title = "Optimizing stresses for testing DRAM cell defects using electrical simulations",
keywords = "Elektrotechniek, Techniek, Conf.proc. > 3 pag",
author = "Z Al-Ars and {van de Goor}, AJ and J Braun and D Richter",
year = "2003",
language = "Undefined/Unknown",
isbn = "0-7695-1870-2",
publisher = "IEEE Society",
pages = "484--489",
editor = "N Wehn and D Verkest",
booktitle = "DATE '03; design, automation and test in Europe",
note = "design, automation and test in Europe, Messe Munich, Germany ; Conference date: 03-03-2003 Through 07-03-2003",
}