Optimizing test length for soft faults in DRAM devices

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

6 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	25th IEEE VLSI Test Symposium
Editors	s.n.
Place of Publication	Piscataway
Publisher	IEEE
Pages	59-66
Number of pages	8
ISBN (Print)	0-7695-2812-0
Publication status	Published - 2007
Event	IEEE VTS'07 - Piscataway Duration: 6 May 2007 → 10 May 2007

Name
Publisher	IEEE

Conference	IEEE VTS'07
Period	6/05/07 → 10/05/07

Keywords

@inproceedings{b0c64310269448a387d1beba94ae2b6e,

title = "Optimizing test length for soft faults in DRAM devices",

keywords = "conference contrib. refereed, Conf.proc. > 3 pag",

author = "Z Al-Ars and S Hamdioui and GN Gaydadjiev",

year = "2007",

language = "Undefined/Unknown",

isbn = "0-7695-2812-0",

publisher = "IEEE",

pages = "59--66",

editor = "s.n.",

booktitle = "25th IEEE VLSI Test Symposium",

address = "United States",

note = "IEEE VTS'07 ; Conference date: 06-05-2007 Through 10-05-2007",

}

TY - GEN

T1 - Optimizing test length for soft faults in DRAM devices

AU - Al-Ars, Z

AU - Hamdioui, S

AU - Gaydadjiev, GN

PY - 2007

Y1 - 2007

KW - conference contrib. refereed

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7695-2812-0

SP - 59

EP - 66

BT - 25th IEEE VLSI Test Symposium

A2 - s.n., null

PB - IEEE

CY - Piscataway

T2 - IEEE VTS'07

Y2 - 6 May 2007 through 10 May 2007

ER -