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Origin of Degradation in Si-Based All-Solid-State Li-Ion Microbatteries
Chunguang Chen, Jos F.M. Oudenhoven, Dmitri L. Danilov, Egor Vezhlev, Lu Gao, Na Li, Fokko M. Mulder, Rüdiger A. Eichel, Peter H.L. Notten*
*Corresponding author for this work
Research output: Contribution to journal › Article › Scientific › peer-review
39
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(Scopus)