Outlier detection using ball descriptions with adjustable metric

DMJ Tax, P Juszczak, EM Pekalska, RPW Duin

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

12 Citations (Scopus)

Abstract

Sometimesnoveloroutlierdatahastobedetected.Theoutliersmayindicatesomeinterestingrareevent,ortheyshouldbedisregardedbecausetheycannotbereliablyprocessedfurther.Intheidealcasethattheobjectsarerepresentedbyverygoodfeatures,thegenuinedataformsacompactclusterandagoodoutliermeasureisthedistancetotheclustercenter.Thispaperproposesthreenewformulationsto¿ndagoodclustercentertogetherwithanoptimizedp-distancemeasure.Experimentsshowthatforsomerealworlddatasetsverygoodclassi¿cationresultsareobtainedandthat,morespeci¿cally,the1-distanceisparticularlysuitedfordatasetscontainingdiscretefeaturevalues.
Original languageUndefined/Unknown
Title of host publicationStructural, syntactic and statistical pattern recognition
EditorsDY Yeung, JT Kwok, A Fred, F Roli, D de Ridder
Place of PublicationBerlin-Heidelberg
PublisherSpringer
Pages587-595
Number of pages9
ISBN (Print)3-540-37236-9
Publication statusPublished - 2006
EventJoint IAPR International Workshops SSPR 2006 and SPR 2006, Hong Kong, China - Heidelberg
Duration: 17 Aug 200619 Aug 2006

Publication series

Name
PublisherSpringer
NameLecture Notes in Computer Science
Volume4109
ISSN (Print)0302-9743

Conference

ConferenceJoint IAPR International Workshops SSPR 2006 and SPR 2006, Hong Kong, China
Period17/08/0619/08/06

Keywords

  • Wiskunde en Informatica
  • Techniek
  • technische Wiskunde en Informatica
  • conference contrib. refereed
  • CWTS 0.75 <= JFIS < 2.00

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