Outlook: From Physics of Failure to Physics of Degradation

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Abstract

In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we envision that physics of failure will be replaced by physics of degradation. New technologies, like health monitoring and digital twins, are needed to make this foreseen shift in reliability concepts.
Original languageEnglish
Title of host publicationReliability of Organic Compounds in Microelectronics and Optoelectronics
Subtitle of host publicationFrom Physics-of-Failure to Physics-of-Degradation
EditorsWillem Dirk van Driel, Maryam Yazdan Mehr
PublisherSpringer
Pages535-538
Number of pages4
ISBN (Electronic)978-3-030-81576-9
ISBN (Print)978-3-030-81575-2
DOIs
Publication statusPublished - 2022

Bibliographical note

Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-care
Otherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.

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