Abstract
In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we envision that physics of failure will be replaced by physics of degradation. New technologies, like health monitoring and digital twins, are needed to make this foreseen shift in reliability concepts.
Original language | English |
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Title of host publication | Reliability of Organic Compounds in Microelectronics and Optoelectronics |
Subtitle of host publication | From Physics-of-Failure to Physics-of-Degradation |
Editors | Willem Dirk van Driel, Maryam Yazdan Mehr |
Publisher | Springer |
Pages | 535-538 |
Number of pages | 4 |
ISBN (Electronic) | 978-3-030-81576-9 |
ISBN (Print) | 978-3-030-81575-2 |
DOIs | |
Publication status | Published - 2022 |
Bibliographical note
Green Open Access added to TU Delft Institutional Repository ‘You share, we take care!’ – Taverne project https://www.openaccess.nl/en/you-share-we-take-careOtherwise as indicated in the copyright section: the publisher is the copyright holder of this work and the author uses the Dutch legislation to make this work public.