Overhang control in topology optimization: a comparison of continuous front propagation-based and discrete layer-by-layer overhang control

Emiel van de Ven*, Robert Maas, Can Ayas, Matthijs Langelaar, Fred van Keulen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
9 Downloads (Pure)

Abstract

Although additive manufacturing (AM) allows for a large design freedom, there are some manufacturing limitations that have to be taken into consideration. One of the most restricting design rules is the minimum allowable overhang angle. To make topology optimization suitable for AM, several algorithms have been published to enforce a minimum overhang angle. In this work, the layer-by-layer overhang filter proposed by Langelaar (Struct Multidiscip Optim 55(3):871–883, 2017), and the continuous, front propagation-based, overhang filter proposed by van de Ven et al. (Struct Multidiscipl Optim 57(5):2075–2091, 2018) are compared in detail. First, it is shown that the discrete layer-by-layer filter can be formulated in a continuous setting using front propagation. Then, a comparison is made in which the advantages and disadvantages of both methods are highlighted. Finally, the continuous overhang filter is improved by incorporating complementary aspects of the layer-by-layer filter: continuation of the overhang filter and a parameter that had to be user-defined are no longer required. An implementation of the improved continuous overhang filter is provided.

Original languageEnglish
Pages (from-to)761-778
JournalStructural and Multidisciplinary Optimization
Volume64
Issue number2
DOIs
Publication statusPublished - 2021

Keywords

  • Additive manufacturing
  • Front propagation
  • Overhang angle
  • Topology optimization

Fingerprint

Dive into the research topics of 'Overhang control in topology optimization: a comparison of continuous front propagation-based and discrete layer-by-layer overhang control'. Together they form a unique fingerprint.

Cite this