Parameterising styling lines for reverse design using free form shape analysis

TR Langerak; JSM Vergeest; Y Song

Parameterising styling lines for reverse design using free form shape analysis

TR Langerak, JSM Vergeest, Y Song

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

3 Citations (Scopus)

Original language	Undefined/Unknown
Title of host publication	Proceedings of IDECT/CIE 2005
Place of Publication	New York
Publisher	ASME
Pages	1-8
Number of pages	8
ISBN (Print)	0-7918-3766-1
Publication status	Published - 2005
Event	ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, Long Beach, California, USA - New York Duration: 24 Sept 2005 → 28 Sept 2005

Publication series

Name
Publisher	ASME

Conference

Conference	ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, Long Beach, California, USA
Period	24/09/05 → 28/09/05

Bibliographical note

Editor onbekend JH

Keywords

Conf.proc. > 3 pag

Cite this

@inproceedings{d7b794e0c9664d65b5d15ab1899bbfd1,

title = "Parameterising styling lines for reverse design using free form shape analysis",

keywords = "Conf.proc. > 3 pag",

author = "TR Langerak and JSM Vergeest and Y Song",

note = "Editor onbekend JH; ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, Long Beach, California, USA ; Conference date: 24-09-2005 Through 28-09-2005",

year = "2005",

language = "Undefined/Unknown",

isbn = "0-7918-3766-1",

publisher = "ASME",

pages = "1--8",

booktitle = "Proceedings of IDECT/CIE 2005",

address = "United States",

}

TY - GEN

T1 - Parameterising styling lines for reverse design using free form shape analysis

AU - Langerak, TR

AU - Vergeest, JSM

AU - Song, Y

N1 - Editor onbekend JH

PY - 2005

Y1 - 2005

KW - Conf.proc. > 3 pag

M3 - Conference contribution

SN - 0-7918-3766-1

SP - 1

EP - 8

BT - Proceedings of IDECT/CIE 2005

PB - ASME

CY - New York

T2 - ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, Long Beach, California, USA

Y2 - 24 September 2005 through 28 September 2005

ER -