Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards

F. Mubarak, V. Mascolo, G. Rietveld, M. Spirito, K. Daffe, K. Haddadi

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

2 Citations (Scopus)

Abstract

Methods for traceable characterization and uncertainty evaluation of planar I-port CPW short-open-Ioad (SOL) devices are developed. The agreement of modelling and verification measurement results greatly supports the application of the proposed parameterization models and used FEM-based EM modelling of CPW structures for traceable characterization of planar CPW-based SOL devices in the frequency range between a few kHz up to 50 GHz.

Original languageEnglish
Title of host publicationCPEM 2018 - Conference on Precision Electromagnetic Measurements
EditorsPhilip Tuckey, François Piquemal, Olivier Thévenot
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Number of pages2
ISBN (Electronic)978-1-5386-0973-6
DOIs
Publication statusPublished - 2018
Event2018 Conference on Precision Electromagnetic Measurements, CPEM 2018 - Paris, France
Duration: 8 Jul 201813 Jul 2018

Conference

Conference2018 Conference on Precision Electromagnetic Measurements, CPEM 2018
CountryFrance
CityParis
Period8/07/1813/07/18

Keywords

  • co-planar waveguide
  • EM simulation
  • measurement uncertainty
  • nanostructures
  • on-wafer calibration
  • precision measurements
  • traceability
  • VNA

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    Mubarak, F., Mascolo, V., Rietveld, G., Spirito, M., Daffe, K., & Haddadi, K. (2018). Parameterization Models for Traceable Characterization of Planar CPW SOL Calibration Standards. In P. Tuckey, F. Piquemal, & O. Thévenot (Eds.), CPEM 2018 - Conference on Precision Electromagnetic Measurements [8500810] Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/CPEM.2018.8500810