Perovskite thin films via atomic layer deposition

Brandon R. Sutherland; Sjoerd Hoogland; Michael M. Adachi; Pongsakorn Kanjanaboos; Chris T O Wong; Jeffrey J. McDowell; Jixian Xu; Oleksandr Voznyy; Zhijun Ning; Arjan J. Houtepen; Edward H. Sargent

doi:10.1002/adma.201403965

Perovskite thin films via atomic layer deposition

Brandon R. Sutherland, Sjoerd Hoogland, Michael M. Adachi, Pongsakorn Kanjanaboos, Chris T O Wong, Jeffrey J. McDowell, Jixian Xu, Oleksandr Voznyy, Zhijun Ning, Arjan J. Houtepen, Edward H. Sargent^*

^*Corresponding author for this work

ChemE/Opto-electronic Materials

Research output: Contribution to journal › Article › Scientific › peer-review

207 Citations (Scopus)

Abstract

(Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI₂ and subsequently CH₃NH₃PbI₃ perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm^-1.

Original language	English
Pages (from-to)	53-58
Number of pages	6
Journal	Advanced Materials
Volume	27
Issue number	1
DOIs	https://doi.org/10.1002/adma.201403965
Publication status	Published - 7 Jan 2015

Keywords

Atomic layer deposition
Optical gain
Perovskites
Transient absorption

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@article{5ac3d21d82e84b98804ff6412695eacb,

title = "Perovskite thin films via atomic layer deposition",

abstract = "(Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI2 and subsequently CH3NH3PbI3 perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm-1.",

keywords = "Atomic layer deposition, Optical gain, Perovskites, Transient absorption",

author = "Sutherland, {Brandon R.} and Sjoerd Hoogland and Adachi, {Michael M.} and Pongsakorn Kanjanaboos and Wong, {Chris T O} and McDowell, {Jeffrey J.} and Jixian Xu and Oleksandr Voznyy and Zhijun Ning and Houtepen, {Arjan J.} and Sargent, {Edward H.}",

year = "2015",

month = jan,

day = "7",

doi = "10.1002/adma.201403965",

language = "English",

volume = "27",

pages = "53--58",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley",

number = "1",

}

TY - JOUR

T1 - Perovskite thin films via atomic layer deposition

AU - Sutherland, Brandon R.

AU - Hoogland, Sjoerd

AU - Adachi, Michael M.

AU - Kanjanaboos, Pongsakorn

AU - Wong, Chris T O

AU - McDowell, Jeffrey J.

AU - Xu, Jixian

AU - Voznyy, Oleksandr

AU - Ning, Zhijun

AU - Houtepen, Arjan J.

AU - Sargent, Edward H.

PY - 2015/1/7

Y1 - 2015/1/7

N2 - (Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI2 and subsequently CH3NH3PbI3 perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm-1.

AB - (Graph Presented) A new method to deposit perovskite thin films that benefit from the thickness control and conformality of atomic layer deposition (ALD) is detailed. A seed layer of ALD PbS is place-exchanged with PbI2 and subsequently CH3NH3PbI3 perovskite. These films show promising optical properties, with gain coefficients of 3200 ± 830 cm-1.

KW - Atomic layer deposition

KW - Optical gain

KW - Perovskites

KW - Transient absorption

UR - http://www.scopus.com/inward/record.url?scp=84920167983&partnerID=8YFLogxK

U2 - 10.1002/adma.201403965

DO - 10.1002/adma.201403965

M3 - Article

AN - SCOPUS:84920167983

SN - 0935-9648

VL - 27

SP - 53

EP - 58

JO - Advanced Materials

JF - Advanced Materials

IS - 1

ER -

Perovskite thin films via atomic layer deposition

Abstract

Keywords

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