Perspectives on Emerging Computation-in-Memory Paradigms

Shubham Rai, Mengyun Liu, Anteneh Gebregiorgis, Debjyoti Bhattacharjee, Krishnendu Chakrabarty, Said Hamdioui, Anupam Chattopadhyay, Jens Trommer, Akash Kumar

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

3 Citations (Scopus)


The traditional Von-Neumann architecture is reaching its limits and finding it difficult to cope up with the ever-increasing demands of modern workloads like artificial intelligence. This demand has fueled the search of technologies that can mimic human brain to efficiently combine both memory and computation within a single device. In this work, we present the state-of-the-art research in the domain of computation-in-memory. In particular, we take a look at memristors and its widespread application in neuromorphic computation. We introduce ReRAMs in terms of their novel computing paradigms and present ReRAM-specific design flows. We address the various circuit opportunities and challenges related to reliability and fault tolerance associated with them. Another high-potential candidate to leverage memory and computation from a single device is Ferroelectric Field-effect Transistor (FeFET). Here we present a co-integration of such FeFETs with another emerging nanotechnology concept, called Reconfigurable Field Effect Transistor (RFET) and discuss the impact of the higher amount of states provided by this combination.
Original languageEnglish
Title of host publication2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Place of PublicationPiscataway
Number of pages10
ISBN (Electronic)978-3-9819263-5-4
ISBN (Print)978-1-7281-6336-9
Publication statusPublished - 2021
Event2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Virtual, Virtual/Grenoble, France
Duration: 1 Feb 20215 Feb 2021


Conference2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Abbreviated titleDATE'21
Internet address


  • Fault tolerance
  • Neuromorphics
  • Memory management
  • Fault tolerant systems
  • Memristors
  • Computational efficiency
  • Integrated circuit reliability


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