Abstract
The traditional Von-Neumann architecture is reaching its limits and finding it difficult to cope up with the ever-increasing demands of modern workloads like artificial intelligence. This demand has fueled the search of technologies that can mimic human brain to efficiently combine both memory and computation within a single device. In this work, we present the state-of-the-art research in the domain of computation-in-memory. In particular, we take a look at memristors and its widespread application in neuromorphic computation. We introduce ReRAMs in terms of their novel computing paradigms and present ReRAM-specific design flows. We address the various circuit opportunities and challenges related to reliability and fault tolerance associated with them. Another high-potential candidate to leverage memory and computation from a single device is Ferroelectric Field-effect Transistor (FeFET). Here we present a co-integration of such FeFETs with another emerging nanotechnology concept, called Reconfigurable Field Effect Transistor (RFET) and discuss the impact of the higher amount of states provided by this combination.
Original language | English |
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Title of host publication | 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
Place of Publication | Piscataway |
Publisher | IEEE |
Pages | 1925-1934 |
Number of pages | 10 |
ISBN (Electronic) | 978-3-9819263-5-4 |
ISBN (Print) | 978-1-7281-6336-9 |
DOIs | |
Publication status | Published - 2021 |
Event | 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Virtual, Virtual/Grenoble, France Duration: 1 Feb 2021 → 5 Feb 2021 https://www.date-conference.com/ |
Conference
Conference | 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) |
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Abbreviated title | DATE'21 |
Country/Territory | France |
City | Virtual/Grenoble |
Period | 1/02/21 → 5/02/21 |
Internet address |
Keywords
- Fault tolerance
- Neuromorphics
- Memory management
- Fault tolerant systems
- Memristors
- Computational efficiency
- Integrated circuit reliability