Photodiode structures to measure the shape of particles and cells

JH Nieuwenhuis; SS Lee; J Bastemeijer; A Bossche; MJ Vellekoop

Photodiode structures to measure the shape of particles and cells

JH Nieuwenhuis, SS Lee, J Bastemeijer, A Bossche, MJ Vellekoop

Electronic Instrumentation

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	839-842
Number of pages	4
ISBN (Print)	90-73461-29-4
Publication status	Published - 2001
Event	SAFE ProRISC SeSens 2001, Veldhoven - Utrecht Duration: 28 Nov 2001 → 30 Nov 2001

Publication series

Name
Publisher	STW technology foundation

Conference

Conference	SAFE ProRISC SeSens 2001, Veldhoven
Period	28/11/01 → 30/11/01

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

Nieuwenhuis, JH., Lee, SS., Bastemeijer, J., Bossche, A., & Vellekoop, MJ. (2001). Photodiode structures to measure the shape of particles and cells. In SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology (pp. 839-842). STW Technology Foundation.

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title = "Photodiode structures to measure the shape of particles and cells",

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author = "JH Nieuwenhuis and SS Lee and J Bastemeijer and A Bossche and MJ Vellekoop",

year = "2001",

language = "Undefined/Unknown",

isbn = "90-73461-29-4",

publisher = "STW Technology Foundation",

pages = "839--842",

booktitle = "SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology",

note = "SAFE ProRISC SeSens 2001, Veldhoven ; Conference date: 28-11-2001 Through 30-11-2001",

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Nieuwenhuis, JH, Lee, SS, Bastemeijer, J , Bossche, A & Vellekoop, MJ 2001, Photodiode structures to measure the shape of particles and cells. in SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology. STW Technology Foundation, Utrecht, pp. 839-842, SAFE ProRISC SeSens 2001, Veldhoven, 28/11/01.

Photodiode structures to measure the shape of particles and cells. / Nieuwenhuis, JH; Lee, SS; Bastemeijer, J et al.
SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology. Utrecht: STW Technology Foundation, 2001. p. 839-842.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Photodiode structures to measure the shape of particles and cells

AU - Nieuwenhuis, JH

AU - Lee, SS

AU - Bastemeijer, J

AU - Bossche, A

AU - Vellekoop, MJ

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 90-73461-29-4

SP - 839

EP - 842

BT - SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology

PB - STW Technology Foundation

CY - Utrecht

T2 - SAFE ProRISC SeSens 2001, Veldhoven

Y2 - 28 November 2001 through 30 November 2001

ER -

Nieuwenhuis JH, Lee SS, Bastemeijer J , Bossche A, Vellekoop MJ. Photodiode structures to measure the shape of particles and cells. In SAFE - ProRISC - SeSens 2001: proceedings. Semiconductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology. Utrecht: STW Technology Foundation. 2001. p. 839-842