Photometric and colorimetric assessment of LED chip scale packages by using a step-stress accelerated degradation test (SSADT) method

Cheng Qian, Jiajie Fan, Jiayi Fang, Chaohua Yu, Yi Ren*, Xuejun Fan, Guoqi Zhang

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

7 Citations (Scopus)
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