Physics-based stability analysis of MOS transistors

A Ferrara, PG Steeneken, BK Boksteen, A Heringa, AJ Scholten, J Schmitz, RJE Hueting

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)28-34
Number of pages7
JournalSolid-State Electronics
Volume113
DOIs
Publication statusPublished - 2015

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