PIM generation by rough conductors

Paolo Ansuinelli; Fabrizio Frezza; Alex Schuchinsky

doi:10.1109/iWEM.2017.7968786

PIM generation by rough conductors

Paolo Ansuinelli, Fabrizio Frezza, Alex Schuchinsky

ImPhys/Optics

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

2 Citations (Scopus)

Abstract

The effect of conductor surface roughness on electro-thermally (ET) induced passive intermodulation (PIM) products is analysed and discussed. The analytical model combined with the commercial simulator SIMBEOR is used to examine the products of ET nonlinearity, which is significantly influenced by the surface topography of the conductor. It is further shown that, in spite of the rise of ohmic losses with frequency, conductor roughness may somewhat allay the ET-PIM growth due to concurrent increase of additional heat-sinking provided by the interiors of dendrites and conductor cladding.

Original language	English
Title of host publication	2017 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017
Editors	Y. Wang, K.K. So
Publisher	IEEE
Pages	44-46
Number of pages	3
ISBN (Electronic)	9781509063925
DOIs	https://doi.org/10.1109/iWEM.2017.7968786
Publication status	Published - 5 Jul 2017
Event	8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017 - London, United Kingdom Duration: 30 May 2017 → 1 Jun 2017

Conference

Conference	8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017
Country/Territory	United Kingdom
City	London
Period	30/05/17 → 1/06/17

Access to Document

10.1109/iWEM.2017.7968786

Cite this

@inproceedings{47dc6410b3d945a7a3444a5a3279626d,

title = "PIM generation by rough conductors",

abstract = "The effect of conductor surface roughness on electro-thermally (ET) induced passive intermodulation (PIM) products is analysed and discussed. The analytical model combined with the commercial simulator SIMBEOR is used to examine the products of ET nonlinearity, which is significantly influenced by the surface topography of the conductor. It is further shown that, in spite of the rise of ohmic losses with frequency, conductor roughness may somewhat allay the ET-PIM growth due to concurrent increase of additional heat-sinking provided by the interiors of dendrites and conductor cladding.",

author = "Paolo Ansuinelli and Fabrizio Frezza and Alex Schuchinsky",

year = "2017",

month = jul,

day = "5",

doi = "10.1109/iWEM.2017.7968786",

language = "English",

pages = "44--46",

editor = "Y. Wang and K.K. So",

booktitle = "2017 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017",

publisher = "IEEE",

address = "United States",

note = "8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017 ; Conference date: 30-05-2017 Through 01-06-2017",

}

Ansuinelli, P, Frezza, F & Schuchinsky, A 2017, PIM generation by rough conductors. in Y Wang & KK So (eds), 2017 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017., 7968786, IEEE, pp. 44-46, 8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017, London, United Kingdom, 30/05/17. https://doi.org/10.1109/iWEM.2017.7968786

PIM generation by rough conductors. / Ansuinelli, Paolo; Frezza, Fabrizio; Schuchinsky, Alex.
2017 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017. ed. / Y. Wang; K.K. So. IEEE, 2017. p. 44-46 7968786.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - PIM generation by rough conductors

AU - Ansuinelli, Paolo

AU - Frezza, Fabrizio

AU - Schuchinsky, Alex

PY - 2017/7/5

Y1 - 2017/7/5

N2 - The effect of conductor surface roughness on electro-thermally (ET) induced passive intermodulation (PIM) products is analysed and discussed. The analytical model combined with the commercial simulator SIMBEOR is used to examine the products of ET nonlinearity, which is significantly influenced by the surface topography of the conductor. It is further shown that, in spite of the rise of ohmic losses with frequency, conductor roughness may somewhat allay the ET-PIM growth due to concurrent increase of additional heat-sinking provided by the interiors of dendrites and conductor cladding.

AB - The effect of conductor surface roughness on electro-thermally (ET) induced passive intermodulation (PIM) products is analysed and discussed. The analytical model combined with the commercial simulator SIMBEOR is used to examine the products of ET nonlinearity, which is significantly influenced by the surface topography of the conductor. It is further shown that, in spite of the rise of ohmic losses with frequency, conductor roughness may somewhat allay the ET-PIM growth due to concurrent increase of additional heat-sinking provided by the interiors of dendrites and conductor cladding.

UR - http://www.scopus.com/inward/record.url?scp=85027149819&partnerID=8YFLogxK

U2 - 10.1109/iWEM.2017.7968786

DO - 10.1109/iWEM.2017.7968786

M3 - Conference contribution

AN - SCOPUS:85027149819

SP - 44

EP - 46

BT - 2017 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017

A2 - Wang, Y.

A2 - So, K.K.

PB - IEEE

T2 - 8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017

Y2 - 30 May 2017 through 1 June 2017

ER -

PIM generation by rough conductors

Abstract

Conference

Access to Document

Other files and links

Fingerprint

Cite this