PIM generation by rough conductors

Paolo Ansuinelli, Fabrizio Frezza, Alex Schuchinsky

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

1 Citation (Scopus)

Abstract

The effect of conductor surface roughness on electro-thermally (ET) induced passive intermodulation (PIM) products is analysed and discussed. The analytical model combined with the commercial simulator SIMBEOR is used to examine the products of ET nonlinearity, which is significantly influenced by the surface topography of the conductor. It is further shown that, in spite of the rise of ohmic losses with frequency, conductor roughness may somewhat allay the ET-PIM growth due to concurrent increase of additional heat-sinking provided by the interiors of dendrites and conductor cladding.

Original languageEnglish
Title of host publication2017 International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017
EditorsY. Wang, K.K. So
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages44-46
Number of pages3
ISBN (Electronic)9781509063925
DOIs
Publication statusPublished - 5 Jul 2017
Event8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017 - London, United Kingdom
Duration: 30 May 20171 Jun 2017

Conference

Conference8th International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2017
CountryUnited Kingdom
CityLondon
Period30/05/171/06/17

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