Polarisation-aberration retrieval for high-NA systems using the extended Nijboer-Zernike diffraction theory.

JJM Braat, P. Dirksen, AJEM Janssen, AS van de Nes

Research output: Contribution to conference › Poster › Professional

Original language	Undefined/Unknown
Publication status	Published - 2005
Event	Focus on Microscopy (FOM) - Jena, Germany Duration: 21 Mar 2005 → 24 Mar 2005

Other	Focus on Microscopy (FOM)
Period	21/03/05 → 24/03/05

Keywords

@conference{e732d02a9c6d44aebd9dca29ecb4498a,

title = "Polarisation-aberration retrieval for high-NA systems using the extended Nijboer-Zernike diffraction theory.",

keywords = "other public output, Geen BTA classificatie",

author = "JJM Braat and P. Dirksen and AJEM Janssen and {van de Nes}, AS",

year = "2005",

language = "Undefined/Unknown",

note = "Focus on Microscopy (FOM) ; Conference date: 21-03-2005 Through 24-03-2005",

}