Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants

VP Jordanov; R Ishihara; PM Sarro; MJ Vellekoop; RF Wolffenbuttel; J Bastemeijer; A Bossche

Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants

VP Jordanov, R Ishihara, PM Sarro, MJ Vellekoop, RF Wolffenbuttel, J Bastemeijer, A Bossche

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology
Place of Publication	Utrecht
Publisher	STW Technology Foundation
Pages	799-802
Number of pages	4
ISBN (Print)	90-73461-29-4
Publication status	Published - 2001
Event	SAFE ProRISC SeSens 2001, Veldhoven - Utrecht Duration: 28 Nov 2001 → 30 Nov 2001

Publication series

Name
Publisher	STW technology foundation

Conference

Conference	SAFE ProRISC SeSens 2001, Veldhoven
Period	28/11/01 → 30/11/01

Keywords

ZX Int.klas.verslagjaar < 2002

Cite this

Jordanov, VP., Ishihara, R., Sarro, PM., Vellekoop, MJ., Wolffenbuttel, RF., Bastemeijer, J., & Bossche, A. (2001). Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants. In SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology (pp. 799-802). STW Technology Foundation.

Jordanov, VP ; Ishihara, R ; Sarro, PM et al. / Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants. SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology. Utrecht : STW Technology Foundation, 2001. pp. 799-802

@inproceedings{29d22980e430477bade59c64ca521661,

title = "Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants",

keywords = "ZX Int.klas.verslagjaar < 2002",

author = "VP Jordanov and R Ishihara and PM Sarro and MJ Vellekoop and RF Wolffenbuttel and J Bastemeijer and A Bossche",

year = "2001",

language = "Undefined/Unknown",

isbn = "90-73461-29-4",

publisher = "STW Technology Foundation",

pages = "799--802",

booktitle = "SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology",

note = "SAFE ProRISC SeSens 2001, Veldhoven ; Conference date: 28-11-2001 Through 30-11-2001",

}

Jordanov, VP, Ishihara, R , Sarro, PM, Vellekoop, MJ, Wolffenbuttel, RF , Bastemeijer, J & Bossche, A 2001, Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants. in SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology. STW Technology Foundation, Utrecht, pp. 799-802, SAFE ProRISC SeSens 2001, Veldhoven, 28/11/01.

Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants. / Jordanov, VP; Ishihara, R ; Sarro, PM et al.
SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology. Utrecht: STW Technology Foundation, 2001. p. 799-802.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants

AU - Jordanov, VP

AU - Ishihara, R

AU - Sarro, PM

AU - Vellekoop, MJ

AU - Wolffenbuttel, RF

AU - Bastemeijer, J

AU - Bossche, A

PY - 2001

Y1 - 2001

KW - ZX Int.klas.verslagjaar < 2002

M3 - Conference contribution

SN - 90-73461-29-4

SP - 799

EP - 802

BT - SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology

PB - STW Technology Foundation

CY - Utrecht

T2 - SAFE ProRISC SeSens 2001, Veldhoven

Y2 - 28 November 2001 through 30 November 2001

ER -

Jordanov VP, Ishihara R , Sarro PM, Vellekoop MJ, Wolffenbuttel RF , Bastemeijer J et al. Polycrystalline silicon thin-film on glass as a UV filter for NADH fluorescence measuremants. In SAFE - ProRISC - SeSens 2001: proceeding. Semicoductor Advances for Future Electronics - Program for Research on Integrated Systems and Circuits - Semiconductor Sensor and Actuator Technology. Utrecht: STW Technology Foundation. 2001. p. 799-802