Porosity in Silicon and Silica Thin Films Monitored by Positrons and Positronium

A van Veen, R Escobar Galindo, SWH Eijt, H Schut, H van Gog, AR Balkenende, F.K. de Theije

    Research output: Contribution to journalArticleScientificpeer-review

    2 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)254-258
    Number of pages5
    JournalMaterials Science Forum
    Publication statusPublished - 2004


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