Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system

AC Kruseman, H Schut, A van Veen, PE Mijnarends, M Clement, JMM de Nijs

    Research output: Contribution to journalArticleScientificpeer-review

    13 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)192-197
    Number of pages6
    JournalApplied Surface Science
    Volume116
    Publication statusPublished - 1997

    Cite this

    Kruseman, AC., Schut, H., van Veen, A., Mijnarends, PE., Clement, M., & de Nijs, JMM. (1997). Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system. Applied Surface Science, 116, 192-197.