Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system

AC Kruseman, H Schut, A van Veen, PE Mijnarends, M Clement, JMM de Nijs

    Research output: Contribution to journalArticlepeer-review

    14 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)192-197
    Number of pages6
    JournalApplied Surface Science
    Volume116
    Publication statusPublished - 1997

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