Positron beam analysis of structurally ordered porosity in mesoporous silica thin films

A van Veen, R Escobar Galindo, H Schut, SWH Eijt, CV Falub, AR Balkenende, F.K. de Theije

    Research output: Contribution to journalArticleScientificpeer-review

    10 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)2-7
    Number of pages6
    JournalMaterials Science and Engineering B: Advanced Functional Solid-state Materials
    VolumeB 102
    Publication statusPublished - 2003

    Keywords

    • ZX CWTS JFIS < 1.00

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