Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

SWH Eijt, R Kind, S Singh, H Schut, WJ Legerstee, RWA Hendrikx, VL Svetchnikov, RJ Westerwaal, B Dam

Research output: Contribution to journal › Article › Scientific › peer-review

Keywords

@article{3118030ec5d047b4bfe73a501be18f24,

title = "Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films",

keywords = "CWTS 0.75 <= JFIS < 2.00",

author = "SWH Eijt and R Kind and S Singh and H Schut and WJ Legerstee and RWA Hendrikx and VL Svetchnikov and RJ Westerwaal and B Dam",

year = "2009",

language = "Undefined/Unknown",

volume = "105",

pages = "043514--1--043514--13",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "AIP Publishing",

}

TY - JOUR

T1 - Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

AU - Eijt, SWH

AU - Kind, R

AU - Singh, S

AU - Schut, H

AU - Legerstee, WJ

AU - Hendrikx, RWA

AU - Svetchnikov, VL

AU - Westerwaal, RJ

AU - Dam, B

PY - 2009

Y1 - 2009

KW - CWTS 0.75 <= JFIS < 2.00

M3 - Article

SN - 0021-8979

VL - 105

SP - 043514-1-043514-13

JO - Journal of Applied Physics

JF - Journal of Applied Physics

ER -