Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

SWH Eijt, R Kind, S Singh, H Schut, WJ Legerstee, RWA Hendrikx, VL Svetchnikov, RJ Westerwaal, B Dam

Research output: Contribution to journalArticleScientificpeer-review

21 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)043514-1-043514-13
JournalJournal of Applied Physics
Volume105
Publication statusPublished - 2009

Keywords

  • CWTS 0.75 <= JFIS < 2.00

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