Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

SWH Eijt, R Kind, S Singh, H Schut, WJ Legerstee, RWA Hendrikx, VL Svetchnikov, RJ Westerwaal, B Dam

Research output: Contribution to journalArticleScientificpeer-review

22 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)043514-1-043514-13
JournalJournal of Applied Physics
Publication statusPublished - 2009


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