Abstract
The ever-increasing resolution of CMOS imagers has had a profound impact on their analog readout electronics, and, in particular, on their ADC architecture. This paper gives an overview of the development of column-parallel ADCs that enable the high-speed and power-efficient readout of high-resolution CMOS imagers. In particular, the recently proposed multiple-ramp single-slope (MRSS) ADC will be discussed.
Original language | Undefined/Unknown |
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Title of host publication | Proceedings IEEE Sensors 2007 |
Editors | s.n. |
Place of Publication | Atlanta |
Publisher | IEEE |
Pages | 523-526 |
Number of pages | 4 |
ISBN (Print) | 978-1-4244-1262-4 |
DOIs | |
Publication status | Published - 2007 |
Event | IEEE Sensors 2007: 6th IEEE Conference on Sensors - Atlanta, GA, United States Duration: 28 Oct 2007 → 31 Oct 2007 |
Conference
Conference | IEEE Sensors 2007 |
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Country/Territory | United States |
City | Atlanta, GA |
Period | 28/10/07 → 31/10/07 |
Keywords
- academic journal papers
- Conf.proc. > 3 pag