Predicting class testability using object-oriented metrics

M Bruntink, A van Deursen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

75 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationSCAM 2004; Proceedings of the Fourth IEEE international worksho on source code analysis an manipulation
Place of PublicationLos Alamitos, CA. USA
PublisherIEEE
Pages136-145
Number of pages10
ISBN (Print)0-7695-2144-4
Publication statusPublished - 2004
EventForth IEEE international workshop on source code analysis and manipulation, Chicago, Ill. USA - Los Alamitos, CA. USA
Duration: 15 Sept 200416 Sept 2004

Publication series

Name
PublisherIEEE Computer Society

Conference

ConferenceForth IEEE international workshop on source code analysis and manipulation, Chicago, Ill. USA
Period15/09/0416/09/04

Bibliographical note

ed. is niet bekend

Keywords

  • Conf.proc. > 3 pag

Cite this