Prioritizing Software Inspection Results using Static Profiling

C. Boogerd, LMF Moonen

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

30 Citations (Scopus)
Original languageUndefined/Unknown
Title of host publicationProceedings of the Sixth IEEE International Workshop on Source Code Analysis and Manipulation (SCAM)
EditorsMassimilia Penta, Leon Moonen
PublisherIEEE
Pages149-158
Number of pages10
Publication statusPublished - 2006

Publication series

Name
PublisherIEEE Computer Society Press

Bibliographical note

BM:SCAM06

Keywords

  • Conf.proc. > 3 pag

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