Process variation aware modeling of interconnect capacitance

Y Bi; D. Ioan; NP van der Meijs

Process variation aware modeling of interconnect capacitance

Signal Processing Systems

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

Original language	Undefined/Unknown
Title of host publication	Proceedings of 19th Annual workshop on Circuits, Systems and Signal Processing, ProRisc 2008
Editors	s.n.
Place of Publication	Utrecht, The Netherlands
Publisher	STW
Pages	1-5
Number of pages	5
ISBN (Print)	90-73461-56-7
Publication status	Published - 2008
Event	PRORISC, Veldhoven, The Netherlands - The Netherlands Duration: 27 Nov 2008 → 28 Nov 2008

Publication series

Name
Publisher	STW

Conference

Conference	PRORISC, Veldhoven, The Netherlands
Period	27/11/08 → 28/11/08

Keywords

Elektrotechniek
Techniek
conference contrib. refereed
Vakpubl., Overig wet. > 3 pag

Cite this

@inproceedings{bdbaea112dbc421b981352826d84d8b6,

title = "Process variation aware modeling of interconnect capacitance",

keywords = "Elektrotechniek, Techniek, conference contrib. refereed, Vakpubl., Overig wet. > 3 pag",

author = "Y Bi and D. Ioan and {van der Meijs}, NP",

year = "2008",

language = "Undefined/Unknown",

isbn = "90-73461-56-7",

publisher = "STW",

pages = "1--5",

editor = "s.n.",

booktitle = "Proceedings of 19th Annual workshop on Circuits, Systems and Signal Processing, ProRisc 2008",

note = "PRORISC, Veldhoven, The Netherlands ; Conference date: 27-11-2008 Through 28-11-2008",

}

Process variation aware modeling of interconnect capacitance. / Bi, Y; Ioan, D.; van der Meijs, NP.
Proceedings of 19th Annual workshop on Circuits, Systems and Signal Processing, ProRisc 2008. ed. / s.n. Utrecht, The Netherlands: STW, 2008. p. 1-5.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Process variation aware modeling of interconnect capacitance

AU - Bi, Y

AU - Ioan, D.

AU - van der Meijs, NP

PY - 2008

Y1 - 2008

KW - Elektrotechniek

KW - Techniek

KW - conference contrib. refereed

KW - Vakpubl., Overig wet. > 3 pag

UR - http://www.stw.nl/prorisc

M3 - Conference contribution

SN - 90-73461-56-7

SP - 1

EP - 5

BT - Proceedings of 19th Annual workshop on Circuits, Systems and Signal Processing, ProRisc 2008

A2 - s.n., null

PB - STW

CY - Utrecht, The Netherlands

T2 - PRORISC, Veldhoven, The Netherlands

Y2 - 27 November 2008 through 28 November 2008

ER -

Process variation aware modeling of interconnect capacitance

Publication series

Conference

Keywords

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Cite this