Processes in the ionization volume of the nano-aperture ion source

Leon van Kouwen*

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review


    The primary purposes of the nano-aperture ion source is emitting ions. However, in the ionization region various other processes occur which may lead to the emission of other species. A theoretical study on such processes was conducted for argon. Besides single charged ions, multiple charged ions become constituents of the beam when using electron impact energies above the second ionization threshold. Rather surprisingly, a small amount of diatomic charged argon is predicted to become part of the beam. For a 1 keV electron beam we expect the beam to consist of about 88% single charged argon, 8% double charged argon, 2% triple charged argon, and 2% diatomic single charged argon.

    Original languageEnglish
    Pages (from-to)343-355
    JournalAdvances in Imaging and Electron Physics
    Publication statusPublished - 2019


    • Associative ionization
    • Diatomic argon
    • Double charged argon
    • Electron impact excitation
    • Electron impact ionization
    • Electron impact momentum transfer
    • Exotic species
    • Hornbeck-Molnar process
    • Metastable argon
    • Nano-aperture ion source
    • Triple charged argon


    Dive into the research topics of 'Processes in the ionization volume of the nano-aperture ion source'. Together they form a unique fingerprint.

    Cite this