Prognostics and thermal management of power electronic packages

Research output: ThesisDissertation (TU Delft)

4 Downloads (Pure)

Abstract

Developing reliable and efficient power semiconductors is essential to realizing a sustainable future. Packaging materials for high-power applications are electrically overstressed, are exposed to harsh environmental conditions, and are subjected to heightened temperature swings, thereby compromising the device’s stability and longevity. In this dissertation, a series of experimental methodologies were explored for monitoring the package conditions, particularly the die-attach interface, which transmits the necessary electrical, thermal, and mechanical signals from the device to the system. Furthermore, advanced thermal management strategies were investigated to circumvent concentrated microthermal hot spots and improve the device’s power rating.
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • Delft University of Technology
Supervisors/Advisors
  • Zhang, G.Q., Promotor
  • van Driel, W.D., Promotor
Thesis sponsors
Award date24 Mar 2025
Electronic ISBNs978-94-6384-741-4
DOIs
Publication statusPublished - 2025

Keywords

  • Condition monitoring
  • Pb-free die-attach
  • Thermal characterization
  • Integrated ThermalManagement
  • Thermal Test Chip

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