Abstract
Developing reliable and efficient power semiconductors is essential to realizing a sustainable future. Packaging materials for high-power applications are electrically overstressed, are exposed to harsh environmental conditions, and are subjected to heightened temperature swings, thereby compromising the device’s stability and longevity. In this dissertation, a series of experimental methodologies were explored for monitoring the package conditions, particularly the die-attach interface, which transmits the necessary electrical, thermal, and mechanical signals from the device to the system. Furthermore, advanced thermal management strategies were investigated to circumvent concentrated microthermal hot spots and improve the device’s power rating.
| Original language | English |
|---|---|
| Qualification | Doctor of Philosophy |
| Awarding Institution |
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| Supervisors/Advisors |
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| Thesis sponsors | |
| Award date | 24 Mar 2025 |
| Electronic ISBNs | 978-94-6384-741-4 |
| DOIs | |
| Publication status | Published - 2025 |
Keywords
- Condition monitoring
- Pb-free die-attach
- Thermal characterization
- Integrated ThermalManagement
- Thermal Test Chip
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An Outlook on Power Electronics Reliability and Reliability Monitoring
Martin, H. A., Smits, E. C. P., Poelma, R. H., van Driel, W. D. & Zhang, G. Q., 2024, Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU Project iRel40. Cham: Springer, p. 251-282 32 p.Research output: Chapter in Book/Conference proceedings/Edited volume › Chapter › Scientific › peer-review
Open AccessFile1 Link opens in a new tab Citation (SciVal)11 Downloads (Pure) -
Exploring the process-microstructure-thermal properties relationship of resin-reinforced Ag sintering material for high-power applications via 3D FIB-SEM nanotomography
Hu, X., Martin, H. A., Poelma, R., Huang, J., van Rijckevorsel, H., Scholten, H., Smits, E., van Driel, W. D. & Zhang, G., 2024, In: Materials and Design. 244, 13 p., 113185.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile4 Link opens in a new tab Citations (SciVal)94 Downloads (Pure) -
Online Condition Monitoring Methodology for Power Electronics Package Reliability Assessment
Martin, H. A., Smits, E. C. P., Poelma, R. H., van Driel, W. D. & Zhang, G., 2024, In: IEEE Transactions on Power Electronics. 39, 4, p. 4725-4734 10 p.Research output: Contribution to journal › Article › Scientific › peer-review
Open AccessFile16 Link opens in a new tab Citations (SciVal)159 Downloads (Pure)
Datasets
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Data underlying the PhD dissertation 'Prognostics and Thermal Management of Power Electronic Packages'
Martin, H. A. (Creator), TU Delft - 4TU.ResearchData, 31 Oct 2024
DOI: 10.4121/845aa72c-e96d-483f-888a-a23c173540b8
Dataset/Software: Dataset
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