@inproceedings{56fd98e1b903465fa19572165c4119ef,
title = "Progress with the IBM very high resolution STEM.",
keywords = "ZX Int.klas.verslagjaar < 2002",
author = "PE Batson and HW Mook and P Kruit and OL Krivanek and N Dellby",
year = "2001",
language = "Undefined/Unknown",
publisher = "Springer",
pages = "--",
booktitle = "Proceedings Microscopy and Microanalysis.",
note = "Microscopy and Microanalysis, Long Beach, Ca., Springer-Verlag, Newyork, Usa. ; Conference date: 05-08-2001 Through 09-08-2001",
}