Progress with the IBM very high resolution STEM.

PE Batson, HW Mook, P Kruit, OL Krivanek, N Dellby

    Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientific

    Original languageUndefined/Unknown
    Title of host publicationProceedings Microscopy and Microanalysis.
    Place of PublicationNew York
    PublisherSpringer
    Pages-
    Publication statusPublished - 2001
    EventMicroscopy and Microanalysis, Long Beach, Ca., Springer-Verlag, Newyork, Usa. - New York
    Duration: 5 Aug 20019 Aug 2001

    Publication series

    Name
    PublisherSpringer-Verlag

    Conference

    ConferenceMicroscopy and Microanalysis, Long Beach, Ca., Springer-Verlag, Newyork, Usa.
    Period5/08/019/08/01

    Keywords

    • ZX Int.klas.verslagjaar < 2002

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