Protection Testing for Multiterminal High-Voltage dc Grid: Procedures and Assessment

Zhou Liu, Seyed Sattar Mirhosseini, Marjan Popov, Yash Audichya, Daniele Colangelo, Sadegh Jamali, Peter Palensky, Weihao Hu, Zhe Chen

Research output: Contribution to journalArticleScientificpeer-review

2 Citations (Scopus)
32 Downloads (Pure)


eAssessment The application of multiterminal (MT), high-voltage dc (HVdc) (MTdc) grid technology requires test procedures for the operation and implementation of the protection solutions. The test procedures are usually derived from experience and from extensive measurement data, which, at present, are still not widely available. Based on a hardware-inthe- loop (HIL) method, advanced dc protection testing strategies, utilizing existing experience for ac grids and requirements for MTdc grids, may overcome this gap.
Original languageEnglish
Article number9205823
Pages (from-to)46-64
Number of pages19
JournalIEEE Industrial Electronics Magazine
Issue number3
Publication statusPublished - 2020

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