Prototype selection for dissimilarity representation by a genetic algorithm

Y Plasencia Calaña, E García-Reyes, M Orozco Alzate, RPW Duin

Research output: Chapter in Book/Conference proceedings/Edited volumeConference contributionScientificpeer-review

17 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 20th International Conference on Pattern Recognition
EditorsJE Guerrero
Place of PublicationNY, NY, USA
PublisherIEEE Society
Pages177-181
Number of pages5
ISBN (Print)978-0-7695-4109-9
DOIs
Publication statusPublished - 2010
Event20th International Conference on Pattern Recognition - NY, NY, USA
Duration: 23 Aug 201026 Aug 2010

Publication series

Name
PublisherIEEE

Conference

Conference20th International Conference on Pattern Recognition
Period23/08/1026/08/10

Keywords

  • conference contrib. refereed
  • Conf.proc. > 3 pag

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