Pulsed-field EMI susceptibility analysis of microelectronic circuits ¿ A full time-domain methodology

AT de Hoop; H Blok; IE Lager; M Stumpf; GAE Vandenbosch

Pulsed-field EMI susceptibility analysis of microelectronic circuits ¿ A full time-domain methodology

AT de Hoop, H Blok, IE Lager, M Stumpf, GAE Vandenbosch

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Title of host publication	Proceedings 42nd European Microwave Conference
Editors	B Nauwelaers, IE Lager et al.
Place of Publication	Louvain-la Neuve, Belgium
Publisher	EuMA
Pages	337-339
Number of pages	3
ISBN (Print)	978-2-87487-027-9
Publication status	Published - 2012
Event	2012 European Microwave Week / EuMC, Amsterdam, The Netherlands - Louvain-la Neuve, Belgium Duration: 29 Oct 2012 → 1 Nov 2012

Publication series

Name
Publisher	EuMA

Conference

Conference	2012 European Microwave Week / EuMC, Amsterdam, The Netherlands
Period	29/10/12 → 1/11/12

Cite this

@inproceedings{194ff7726c4d47228b97656118704d2b,

title = "Pulsed-field EMI susceptibility analysis of microelectronic circuits ¿ A full time-domain methodology",

author = "\{de Hoop\}, AT and H Blok and IE Lager and M Stumpf and GAE Vandenbosch",

year = "2012",

language = "English",

isbn = "978-2-87487-027-9",

publisher = "EuMA",

pages = "337--339",

editor = "B Nauwelaers and \{Lager et al.\}, IE",

booktitle = "Proceedings 42nd European Microwave Conference",

note = "2012 European Microwave Week / EuMC, Amsterdam, The Netherlands ; Conference date: 29-10-2012 Through 01-11-2012",

}

de Hoop, AT, Blok, H, Lager, IE, Stumpf, M & Vandenbosch, GAE 2012, Pulsed-field EMI susceptibility analysis of microelectronic circuits ¿ A full time-domain methodology. in B Nauwelaers & IE Lager et al. (eds), Proceedings 42nd European Microwave Conference. EuMA, Louvain-la Neuve, Belgium, pp. 337-339, 2012 European Microwave Week / EuMC, Amsterdam, The Netherlands, 29/10/12.

Pulsed-field EMI susceptibility analysis of microelectronic circuits ¿ A full time-domain methodology. / de Hoop, AT; Blok, H; Lager, IE et al.
Proceedings 42nd European Microwave Conference. ed. / B Nauwelaers; IE Lager et al. Louvain-la Neuve, Belgium: EuMA, 2012. p. 337-339.

Research output: Chapter in Book/Conference proceedings/Edited volume › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Pulsed-field EMI susceptibility analysis of microelectronic circuits ¿ A full time-domain methodology

AU - de Hoop, AT

AU - Blok, H

AU - Lager, IE

AU - Stumpf, M

AU - Vandenbosch, GAE

PY - 2012

Y1 - 2012

UR - https://www.scopus.com/pages/publications/84874618542

M3 - Conference contribution

SN - 978-2-87487-027-9

SP - 337

EP - 339

BT - Proceedings 42nd European Microwave Conference

A2 - Nauwelaers, B

A2 - Lager et al., IE

PB - EuMA

CY - Louvain-la Neuve, Belgium

T2 - 2012 European Microwave Week / EuMC, Amsterdam, The Netherlands

Y2 - 29 October 2012 through 1 November 2012

ER -

Pulsed-field EMI susceptibility analysis of microelectronic circuits ¿ A full time-domain methodology

Publication series

Conference

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